PDF-4/Axiom is useful for routine phase identification and quantitation. This cost-effective database includes 114,000+ selected data entries and 84,200+ entries with atomic coordinates selected for benchtop users. https://www.icdd.com/pdf-4-axiom/
#RietveldMethod #XRayDiffraction #chemsky
#RietveldMethod #XRayDiffraction #chemsky
January 19, 2026 at 12:01 PM
PDF-4/Axiom is useful for routine phase identification and quantitation. This cost-effective database includes 114,000+ selected data entries and 84,200+ entries with atomic coordinates selected for benchtop users. https://www.icdd.com/pdf-4-axiom/
#RietveldMethod #XRayDiffraction #chemsky
#RietveldMethod #XRayDiffraction #chemsky
Karsten Mesecke: hkl-based calculation of total scattering patterns from discrete and low-dimensional structure models using TOPAS ##RietveldMethod##PairDistributionFunction##Nanomaterials... ##IUCrhttps://journals.iucr.org/paper?S1600576724011749
hkl-based calculation of total scattering patterns from discrete and low-dimensional structure models using TOPAS
A demonstration is given of the use of discrete and low-dimensional structure models within the periodic formalism of conventional Rietveld refinement software for the calculation of total scattering patterns.
journals.iucr.org
January 31, 2025 at 1:00 AM
Karsten Mesecke: hkl-based calculation of total scattering patterns from discrete and low-dimensional structure models using TOPAS ##RietveldMethod##PairDistributionFunction##Nanomaterials... ##IUCrhttps://journals.iucr.org/paper?S1600576724011749