Yuriy Chushkin et al.: Achieving nanosecond time resolution with a two-dimensional X-ray detector ##XRayDetector##XPCS##Timepix4@esrfsynchrotron@desy@EuropeanXFEL...##IUCrhttps://journals.iucr.org/paper?S1600577525006599
Achieving nanosecond time resolution with a two-dimensional X-ray detector
A proof-of-principle of a nanosecond time-resolved experiment is demonstrated using a TEMPUS detector. The concept exploits an event driven mode of the detector and cross-correlation analysis to overcome pixel dead time, and offers new opportunities for time-resolved studies.
journals.iucr.org
August 19, 2025 at 12:00 AM
Yuriy Chushkin et al.: Achieving nanosecond time resolution with a two-dimensional X-ray detector ##XRayDetector##XPCS##Timepix4@esrfsynchrotron@desy@EuropeanXFEL...##IUCrhttps://journals.iucr.org/paper?S1600577525006599
Lena A. Franklin et al.: Characterizing electron-collecting CdTe for use in a 77 ns burst-rate imager ##PixelArrayDetector##CadmiumTelluride##XRayDetector@Cornell@CHESS_user...##IUCrhttps://journals.iucr.org/paper?S160057752400643X
Characterizing electron-collecting CdTe for use in a 77 ns burst-rate imager
The characterization of electron-collecting CdTe for use in a 77 ns burst-rate charge-integrating detector is described.
journals.iucr.org
August 8, 2024 at 12:00 AM
Lena A. Franklin et al.: Characterizing electron-collecting CdTe for use in a 77 ns burst-rate imager ##PixelArrayDetector##CadmiumTelluride##XRayDetector@Cornell@CHESS_user...##IUCrhttps://journals.iucr.org/paper?S160057752400643X
Jonathan Correa et al.: TEMPUS, a Timepix4-based system for the event-based detection of X-rays ##XRayDetector##PhotonScience##EventDriven@desy@desynews@EuropeanXFEL@esrfsynchrotron...##IUCrhttps://journals.iucr.org/paper?S1600577524005319
TEMPUS, a Timepix4-based system for the event-based detection of X-rays
A full description of the TEMPUS system for photon science is given. The detector takes advantage of the new Timepix4 readout chip and, in particular, implements the use of the time-stamping mode for high-resolution timing applications.
journals.iucr.org
July 24, 2024 at 12:00 AM
Jonathan Correa et al.: TEMPUS, a Timepix4-based system for the event-based detection of X-rays ##XRayDetector##PhotonScience##EventDriven@desy@desynews@EuropeanXFEL@esrfsynchrotron...##IUCrhttps://journals.iucr.org/paper?S1600577524005319
X Ray Detector For Non Destructive Testing Market Emerging Markets and New Opportunities in the Semiconductor Sector, 2026 www.marketresearchfuture.com/reports/x-ra...
#XRayDetector #NonDestructiveTesting #NDT #IndustrialInspection #SemiconductorTesting #QualityControl
#XRayDetector #NonDestructiveTesting #NDT #IndustrialInspection #SemiconductorTesting #QualityControl
February 24, 2026 at 5:51 AM
X Ray Detector For Non Destructive Testing Market Emerging Markets and New Opportunities in the Semiconductor Sector, 2026 www.marketresearchfuture.com/reports/x-ra...
#XRayDetector #NonDestructiveTesting #NDT #IndustrialInspection #SemiconductorTesting #QualityControl
#XRayDetector #NonDestructiveTesting #NDT #IndustrialInspection #SemiconductorTesting #QualityControl
X Ray Detector For Non Destructive Testing Market Emerging Markets and New Opportunities in the Semiconductor Sector, 2026 www.marketresearchfuture.com/reports/x-ra...
#XRayDetector #NonDestructiveTesting #IndustrialInspection #ImagingTechnology #SemiconductorSensors #QualityControl
#XRayDetector #NonDestructiveTesting #IndustrialInspection #ImagingTechnology #SemiconductorSensors #QualityControl
February 23, 2026 at 7:31 AM
X Ray Detector For Non Destructive Testing Market Emerging Markets and New Opportunities in the Semiconductor Sector, 2026 www.marketresearchfuture.com/reports/x-ra...
#XRayDetector #NonDestructiveTesting #IndustrialInspection #ImagingTechnology #SemiconductorSensors #QualityControl
#XRayDetector #NonDestructiveTesting #IndustrialInspection #ImagingTechnology #SemiconductorSensors #QualityControl