YouTube video by Berkeley Lab Physical Sciences Area

A theoretical framework for the propagation of partially coherent Gaussian radiation in a modified Mach–Zehnder interferometer designed for Fourier transform spectroscopy applications is presented.

Linear dichroic X-ray tomography is a technique in which the linear dichroism of anisotropic materials is used to image crystal orientation in three dimensions. We show that the reconstruction of tomograms is subject to errors due to the change in polarization on propagation through the material and propose strategies for mitigating these effects.

An environmental cell with fluid flow-through capability for performing in situ nano-mechanical experiments at X-ray nanotomography beamlines and a sample manipulator for mounting nanotomography samples are described.

A description of the beamlines within the structural biology ALS-ENABLE P30 resource at the Advanced Light Source synchrotron at Lawrence Berkeley National Laboratory is given, highlighted through the biophysical characterization of the SpyCatcher–SpyTag protein system.

This controlled radiation damage study at different temperatures allows the approaches to measuring radiation-damage-free/limited spectra from redox-sensitive metalloenzymes and metal complexes in the soft X-ray regime at synchrotrons to be refined.

A protocol for performing correlative micro-nanotomography with scanning electron microscopy analysis at the Advanced Light Source is described. The protocol was used for the analysis of basalt and serpentine mineral samples.

Automated alignment methods have the potential to accelerate greatly the efficiency of experiments done at synchrotron facilities and are an important step towards fully autonomous beamlines. Presented here is a general implementation of Bayesian optimization that performs well on many beamlines across different facilities.

The linear shape control and actuation of a modeled adaptive X-ray optic in a cantilever geometry is described, showing that control is mathematically similar to that of the more common mounting approaches.

The beam shaping optics of synchrotrons and X-ray free-electron lasers are routinely measured using deflectometric profilometers, which use autocollimators to evaluate the surface slope from the displacement of a reticle image on a detector. Here, novel strategies to reduce systematic measurement errors by using a set of overlapping images of the reticle obtained at different positions on the detector, which can reduce the systematic errors by up to a factor of four to five without recourse to external measurements, are discussed.

Vivek Mutalik highlights some of the challenges in synthe...

UCLA-led team maps medium- and high-entropy alloys, identifies potential to tune their properties, making them both stronger and more flexible.

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